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Temperature rise in low-k ULSI interconnects:

, In: Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004.,
Jia Zhou ; Gang Ruan ; Xia Xiao.. - p. 524,525,526,527 , 2004
Link: https://doi.org/10.1109/ICSICT.2004.1435061