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1 Ergebnisse
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Observation of single electron tunneling effect in silicon-..:
, In:
Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004.
,
Zhenrui Yu
;
Aceves, M.
;
Monfil, K.
.. - p. 651,652,653 , 2004
Link:
https://doi.org/10.1109/ICSICT.2004.1435089
RT T1
Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004.
: T1
Observation of single electron tunneling effect in silicon-rich oxide
UL https://suche.suub.uni-bremen.de/peid=ieee-1435089&Exemplar=1&LAN=DE A1 Zhenrui Yu A1 Aceves, M. A1 Monfil, K. A1 Chavez, J.P. A1 Jinhui Du YR 2004 K1 Electrons K1 Tunneling K1 Temperature K1 Voltage K1 Chemical technology K1 Silicon K1 Chemical vapor deposition K1 Annealing K1 Artificial intelligence K1 Electrodes SP 651,652,653 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT.2004.1435089 DO https://doi.org/10.1109/ICSICT.2004.1435089 SF ELIB - SuUB Bremen
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