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1 Ergebnisse
1
Effects of CHE and CHISEL programming operation on the char..:
, In:
Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004.
,
Lei Sun
;
Liyang Pan
;
Ying Zeng
... - p. 695,696,697,698 , 2004
Link:
https://doi.org/10.1109/ICSICT.2004.1435098
RT T1
Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004.
: T1
Effects of CHE and CHISEL programming operation on the characteristics of SONOS memory
UL https://suche.suub.uni-bremen.de/peid=ieee-1435098&Exemplar=1&LAN=DE A1 Lei Sun A1 Liyang Pan A1 Ying Zeng A1 Chen, J. A1 Huiqing Pang A1 Xiyou Li A1 Jun Zhu YR 2004 K1 Channel hot electron injection K1 SONOS devices K1 Voltage K1 Silicon K1 Nonvolatile memory K1 Flash memory K1 Charge carrier processes K1 Electron traps K1 Microelectronics K1 Semiconductor memory SP 695,696,697,698 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT.2004.1435098 DO https://doi.org/10.1109/ICSICT.2004.1435098 SF ELIB - SuUB Bremen
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