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1 Ergebnisse
1
Optimal ramped-gate soft programming of over-erased flash E..:
, In:
Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004.
,
Wu-yun Quan
;
Chang-Ki Baek
;
Kim, D.M.
.. - p. 703,704,705,706 , 2004
Link:
https://doi.org/10.1109/ICSICT.2004.1435100
RT T1 <cTitle>Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004.</cTitle>: T1 <Title>Optimal ramped-gate soft programming of over-erased flash EEPROM cells at given current</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-1435100&Exemplar=1&LAN=DE A1 Wu-yun Quan A1 Chang-Ki Baek A1 Kim, D.M. A1 Ruan Gang A1 Yiping Huang YR 2004 K1 EPROM K1 Threshold voltage K1 Computational modeling K1 Microelectronics K1 Computer science K1 Boosting K1 Voltage control K1 Charge pumps K1 Testing K1 Performance evaluation SP 703,704,705,706 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT.2004.1435100 DO https://doi.org/10.1109/ICSICT.2004.1435100 SF ELIB - SuUB Bremen
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