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1 Ergebnisse
1
The mechanism of self healing electrical breakdown in MOS s..:
, In:
1965 International Electron Devices Meeting
,
Klein, N.
- p. 58 , 1965
Link:
https://doi.org/10.1109/IEDM.1965.187618
RT T1 <cTitle>1965 International Electron Devices Meeting</cTitle>: T1 <Title>The mechanism of self healing electrical breakdown in MOS structures</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-1474199&Exemplar=1&LAN=DE A1 Klein, N. YR 1965 K1 Electric breakdown K1 Silicon K1 Crystallography K1 Heating K1 X-ray lasers K1 Contracts K1 MOS capacitors K1 Electrodes K1 Resistors K1 Glass SP 58 LK http://dx.doi.org/https://doi.org/10.1109/IEDM.1965.187618 DO https://doi.org/10.1109/IEDM.1965.187618 SF ELIB - SuUB Bremen
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