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1 Ergebnisse
1
A low-VTN-channel enhancement mode IGFET for beam-lead seal..:
, In:
1970 International Electron Devices Meeting
,
Dawes, W.R.
;
Fournier, P.R.
;
Fritzinger, L.B.
- p. 112 , 1970
Link:
https://doi.org/10.1109/IEDM.1970.188301
RT T1
1970 International Electron Devices Meeting
: T1
A low-VTN-channel enhancement mode IGFET for beam-lead sealed-junction technology
UL https://suche.suub.uni-bremen.de/peid=ieee-1476413&Exemplar=1&LAN=DE A1 Dawes, W.R. A1 Fournier, P.R. A1 Fritzinger, L.B. YR 1970 K1 MOS capacitors K1 Dielectric substrates K1 Fabrication K1 Platinum K1 Sputtering K1 Metal-insulator structures K1 Dielectrics and electrical insulation K1 Threshold voltage K1 Metallization SP 112 LK http://dx.doi.org/https://doi.org/10.1109/IEDM.1970.188301 DO https://doi.org/10.1109/IEDM.1970.188301 SF ELIB - SuUB Bremen
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