I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Reliability analysis in microelectronic packaging by acoust..:
, In:
28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005.
,
Wolter, K.-J.
;
Speck, M.
;
Heinze, R.
- p. 436,437,438,439,440,441,442,443 , 2005
Link:
https://doi.org/10.1109/ISSE.2005.1491068
RT T1 <cTitle>28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005.</cTitle>: T1 <Title>Reliability analysis in microelectronic packaging by acoustic microscopy</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-1491068&Exemplar=1&LAN=DE A1 Wolter, K.-J. A1 Speck, M. A1 Heinze, R. YR 2005 SN 2161-2528 SN 2161-2064 K1 Microelectronics K1 Microscopy K1 Wafer bonding K1 Nondestructive testing K1 Assembly K1 Plastic packaging K1 Flip chip K1 Heat sinks K1 Multichip modules K1 Copper SP 436,437,438,439,440,441,442,443 LK http://dx.doi.org/https://doi.org/10.1109/ISSE.2005.1491068 DO https://doi.org/10.1109/ISSE.2005.1491068 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
