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DFT architecture for a dynamic fault model of the embedded ..:

, In: 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05),
Yang-Han Lee ; Yih-Guang Jan ; Jei-Jung Shen... - p. 78,79,80,81,82 , 2005
Link: https://doi.org/10.1109/MTDT.2005.8