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1 Ergebnisse
1
Resistive-open defect injection in SRAM core-cell: analysis..:
, In:
Proceedings. 42nd Design Automation Conference, 2005.
,
Dilillo, L.
;
Girard, P.
;
Pravossoudovitch, S.
.. - p. 857,858,859,860,861,862 , 2005
Link:
https://doi.org/10.1145/1065579.1065804
RT T1
Proceedings. 42nd Design Automation Conference, 2005.
: T1
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 /spl mu/m and 90nm technologies
UL https://suche.suub.uni-bremen.de/peid=ieee-1510455&Exemplar=1&LAN=DE A1 Dilillo, L. A1 Girard, P. A1 Pravossoudovitch, S. A1 Virazel, A. A1 Bastian, M. YR 2005 SN 0738-100X K1 Random access memory K1 Testing K1 Robustness K1 Silicon K1 Permission K1 Fault detection K1 Delay K1 Analytical models K1 Design for testability K1 System-on-a-chip SP 857,858,859,860,861,862 LK http://dx.doi.org/https://doi.org/10.1145/1065579.1065804 DO https://doi.org/10.1145/1065579.1065804 SF ELIB - SuUB Bremen
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