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Resistive-open defect injection in SRAM core-cell: analysis..:

, In: Proceedings. 42nd Design Automation Conference, 2005.,
Dilillo, L. ; Girard, P. ; Pravossoudovitch, S... - p. 857,858,859,860,861,862 , 2005
Link: https://doi.org/10.1145/1065579.1065804