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Deep-level transient spectroscopy using low-frequency capac..:

, In: 13th International Conference on Semiconducting and Insulating Materials, 2004. SIMC-XIII-2004.,
Tokuda, Y. ; Nakamura, W. ; Nakashima, K. - p. 222,223,224,225 , 2004
Link: https://doi.org/10.1109/SIM.2005.1511423