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The scaled SAM models and SAR for handset exposure at 835 M..:

, In: IEEE MTT-S International Microwave Symposium Digest, 2005.,
Ae-Kyoung Lee ; Hyung-Do Choi ; Jae-Ick Choi. - p. 1323,1324,1325,1326 , 2005
Link: https://doi.org/10.1109/MWSYM.2005.1516923