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DATE 2006 Special Session: DFM/DFY Design for Manufacturabi..:
, In:
Proceedings of the Design Automation & Test in Europe Conference
,
Ripp, A.
;
Buhler, M.
;
Koehl, J.
... - p. 1-6 , 2006
Link:
https://doi.org/10.1109/DATE.2006.243763
RT T1 <cTitle>Proceedings of the Design Automation & Test in Europe Conference</cTitle>: T1 <Title>DATE 2006 Special Session: DFM/DFY Design for Manufacturability and Yield - influence of process variations in digital, analog and mixed-signal circuit design</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-1656911&Exemplar=1&LAN=DE A1 Ripp, A. A1 Buhler, M. A1 Koehl, J. A1 Bickford, J. A1 Hibbeler, J. A1 Schlichtmann, U. A1 Sommer, R. A1 Pronath, M. YR 2006 SN 1530-1591 SN 1558-1101 K1 Design for manufacture K1 Manufacturing processes K1 Circuit synthesis K1 Integrated circuit technology K1 Integrated circuit yield K1 Robustness K1 Process design K1 Costs K1 Design optimization K1 Timing SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/DATE.2006.243763 DO https://doi.org/10.1109/DATE.2006.243763 SF ELIB - SuUB Bremen
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