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1 Ergebnisse
1
Self-calibration technique for reduction of hold failures i..:
, In:
2006 43rd ACM/IEEE Design Automation Conference
,
Ghosh, S.
;
Mukhopadhyay, S.
;
Keejong Kim
. - p. 971-976 , 2006
Link:
https://doi.org/10.1145/1146909.1147155
RT T1
2006 43rd ACM/IEEE Design Automation Conference
: T1
Self-calibration technique for reduction of hold failures in low-power nano-scaled SRAM
UL https://suche.suub.uni-bremen.de/peid=ieee-1688939&Exemplar=1&LAN=DE A1 Ghosh, S. A1 Mukhopadhyay, S. A1 Keejong Kim A1 Roy, K. YR 2006 SN 0738-100X K1 Random access memory K1 Threshold voltage K1 Programmable control K1 Adaptive control K1 CMOS technology K1 Power engineering computing K1 Data engineering K1 Power engineering and energy K1 Fluctuations K1 Failure analysis K1 Algorithms K1 Design K1 Experimentation K1 Adaptive source biasing K1 hold failures K1 low power SRAM SP 971 OP 976 LK http://dx.doi.org/https://doi.org/10.1145/1146909.1147155 DO https://doi.org/10.1145/1146909.1147155 SF ELIB - SuUB Bremen
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