I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Novel FUSI Strained Engineering for 45-nm Node CMOS Perform..:
, In:
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.
,
Lin, C.T.
;
Ma, G.
;
Hsu, C.H.
... - p. 92-93 , 2006
Link:
https://doi.org/10.1109/VLSIT.2006.1705232
RT T1
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.
: T1
Novel FUSI Strained Engineering for 45-nm Node CMOS Performance Enhancement
UL https://suche.suub.uni-bremen.de/peid=ieee-1705232&Exemplar=1&LAN=DE A1 Lin, C.T. A1 Ma, G. A1 Hsu, C.H. A1 Chen, L.W. A1 Chen, T.F. A1 Hsu, C.R. A1 Lin, C.H. A1 Chiang, S. A1 Cho, D. A1 Tsai, C. YR 2006 SN 0743-1562 SN 2158-9682 K1 Tensile stress K1 MOS devices K1 Thermal stresses K1 Electrodes K1 Compressive stress K1 Degradation K1 Temperature K1 Microelectronics K1 Research and development K1 Cities and towns SP 92 OP 93 LK http://dx.doi.org/https://doi.org/10.1109/VLSIT.2006.1705232 DO https://doi.org/10.1109/VLSIT.2006.1705232 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)