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Improved 1/f Noise Characteristics in Locally Strained Si C..:

, In: 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.,
Ueno, T. ; Lee, Cheol Kyu ; Bae, G.-J.... - p. 104-105 , 2006
Link: https://doi.org/10.1109/VLSIT.2006.1705238