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1 Ergebnisse
1
Pre-Metal Dielectric Stress Engineering by a Novel Plasma T..:
, In:
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.
,
Jeong, Y.-K.
;
Roh, K.
;
Kang, K.-H.
... - p. 136-137 , 2006
Link:
https://doi.org/10.1109/VLSIT.2006.1705254
RT T1
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.
: T1
Pre-Metal Dielectric Stress Engineering by a Novel Plasma Treatment and Integration Scheme for nMOS Performance Improvement
UL https://suche.suub.uni-bremen.de/peid=ieee-1705254&Exemplar=1&LAN=DE A1 Jeong, Y.-K. A1 Roh, K. A1 Kang, K.-H. A1 Choi, Y.-H. A1 Seo, G.-H. A1 Lee, K. A1 Chu, K. A1 Lee, N.-I. A1 Kim, K.C. A1 Shin, D.S. A1 Kim, A. A1 Yoon, I. A1 Nam, S.-W. A1 Lee, S.-J. A1 Park, K.-K. A1 Kim, K. A1 Shin, H.-J. YR 2006 SN 0743-1562 SN 2158-9682 K1 Dielectrics K1 MOS devices K1 Tensile stress K1 Plasma applications K1 Plasma measurements K1 Performance gain K1 Compressive stress K1 Plasma simulation K1 Stress measurement K1 Thickness measurement SP 136 OP 137 LK http://dx.doi.org/https://doi.org/10.1109/VLSIT.2006.1705254 DO https://doi.org/10.1109/VLSIT.2006.1705254 SF ELIB - SuUB Bremen
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