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K and XUV signatures of high K-yieldstructured AR puff load:

, In: The 33rd IEEE International Conference on Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts.,
Lojewski, D. Y. ; Velikovich, A.L. ; Thornhill, J.W.... - p. 400-400 , 2006
Link: https://doi.org/10.1109/PLASMA.2006.1707273