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1 Ergebnisse
1
A Pseudo-Deterministic Functional ATPG based on EFSM Traver..:
, In:
2005 Sixth International Workshop on Microprocessor Test and Verification
,
Di Guglielmo, G.
;
Fummi, F.
;
Marconcini, C.
. - p. None , 2005
Link:
https://doi.org/10.1109/MTV.2005.1
RT T1
2005 Sixth International Workshop on Microprocessor Test and Verification
: T1
A Pseudo-Deterministic Functional ATPG based on EFSM Traversing
UL https://suche.suub.uni-bremen.de/peid=ieee-4022231&Exemplar=1&LAN=DE A1 Di Guglielmo, G. A1 Fummi, F. A1 Marconcini, C. A1 Pravadelli, G. YR 2005 SN 1550-4093 SN 2332-5674 K1 Automatic test pattern generation K1 Circuit faults K1 Testing K1 State-space methods K1 Automata K1 Hardware design languages K1 Engines K1 Navigation K1 Test pattern generators K1 Integrated circuit interconnections SP None LK http://dx.doi.org/https://doi.org/10.1109/MTV.2005.1 DO https://doi.org/10.1109/MTV.2005.1 SF ELIB - SuUB Bremen
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