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ESD Susceptibility of Thick Film Chip Resistors by Means of..:
, In:
2006 1st Electronic Systemintegration Technology Conference
,
Bonfert, D.
;
Wolf, H.
;
Gieser, H.
. - p. None , 2006
Link:
https://doi.org/10.1109/ESTC.2006.280125
RT T1
2006 1st Electronic Systemintegration Technology Conference
: T1
ESD Susceptibility of Thick Film Chip Resistors by Means of Transmission Line Pulsing
UL https://suche.suub.uni-bremen.de/peid=ieee-4060850&Exemplar=1&LAN=DE A1 Bonfert, D. A1 Wolf, H. A1 Gieser, H. A1 Stocker, A. YR 2006 K1 Electrostatic discharge K1 Thick films K1 Resistors K1 Transmission lines K1 Pulse measurements K1 Voltage K1 Electrical resistance measurement K1 Electrostatic measurements K1 Transmission line measurements K1 Semiconductor device measurement SP None LK http://dx.doi.org/https://doi.org/10.1109/ESTC.2006.280125 DO https://doi.org/10.1109/ESTC.2006.280125 SF ELIB - SuUB Bremen
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