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Microstructure Analysis and the Effect of Cr Additive on El..:

, In: Electrical Contacts - 2006. Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts,
Cui, Y.s. ; Wang, Y. ; Shao, W.z... - p. None , 2006
Link: https://doi.org/10.1109/HOLM.2006.284077