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1 Ergebnisse
1
IEEE P1687: Toward Standardized Access of Embedded Instrume..:
, In:
2006 IEEE International Test Conference
,
Posse, Ken
;
Crouch, Al
;
Rearick, Jeff
... - p. None , 2006
Link:
https://doi.org/10.1109/TEST.2006.297744
RT T1
2006 IEEE International Test Conference
: T1
IEEE P1687: Toward Standardized Access of Embedded Instrumentation
UL https://suche.suub.uni-bremen.de/peid=ieee-4079422&Exemplar=1&LAN=DE A1 Posse, Ken A1 Crouch, Al A1 Rearick, Jeff A1 Eklow, Bill A1 Laisne, Mike A1 Bennetts, Ben A1 Doege, Jason A1 Ricchetti, Mike A1 Cote, J-f YR 2006 SN 1089-3539 SN 2378-2250 K1 Instruments K1 Architecture description languages K1 Hardware K1 Standards development K1 Office automation K1 Semiconductor devices K1 Circuit testing K1 Logic testing K1 System testing K1 Shape SP None LK http://dx.doi.org/https://doi.org/10.1109/TEST.2006.297744 DO https://doi.org/10.1109/TEST.2006.297744 SF ELIB - SuUB Bremen
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