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1 Ergebnisse
1
Extremely Low Voltage and High Speed Deep Trapping MONOS Me..:
, In:
2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings
,
Chin, A.
;
Lai, C.H.
;
Yang, H.J.
... - p. None , 2006
Link:
https://doi.org/10.1109/ICSICT.2006.306474
RT T1
2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings
: T1
Extremely Low Voltage and High Speed Deep Trapping MONOS Memory with Good Retention
UL https://suche.suub.uni-bremen.de/peid=ieee-4098222&Exemplar=1&LAN=DE A1 Chin, A. A1 Lai, C.H. A1 Yang, H.J. A1 Chen, W.J. A1 Wu, Y.H. A1 Hwang, H.l. YR 2006 K1 Low voltage K1 MONOS devices K1 Nonvolatile memory K1 SONOS devices K1 Sputtering K1 Degradation K1 Dielectric measurements K1 Velocity measurement K1 Temperature K1 Pulse measurements SP None LK http://dx.doi.org/https://doi.org/10.1109/ICSICT.2006.306474 DO https://doi.org/10.1109/ICSICT.2006.306474 SF ELIB - SuUB Bremen
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