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1 Ergebnisse
1
Improving ATPG Gate-Level Fault Coverage by using Test Vect..:
, In:
2006 IFIP International Conference on Very Large Scale Integration
,
Krug, Margrit Reni
;
Lubaszewski, Marcelo Soares
;
Souza Moraes, Marcelo De
- p. None , 2006
Link:
https://doi.org/10.1109/VLSISOC.2006.313253
RT T1
2006 IFIP International Conference on Very Large Scale Integration
: T1
Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions
UL https://suche.suub.uni-bremen.de/peid=ieee-4107649&Exemplar=1&LAN=DE A1 Krug, Margrit Reni A1 Lubaszewski, Marcelo Soares A1 Souza Moraes, Marcelo De YR 2006 SN 2324-8432 SN 2324-8440 K1 Automatic test pattern generation K1 Hardware design languages K1 Circuit testing K1 Software testing K1 Circuit faults K1 Test pattern generators K1 Performance evaluation K1 Circuit synthesis K1 Software engineering K1 Digital circuits SP None LK http://dx.doi.org/https://doi.org/10.1109/VLSISOC.2006.313253 DO https://doi.org/10.1109/VLSISOC.2006.313253 SF ELIB - SuUB Bremen
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