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1 Ergebnisse
1
The Effect of Gate Current on the Degradation of GaAs PHEMT..:
, In:
[Reliability of Compound Semiconductors] ROCS Workshop 2006
,
Chou, Y. C.
;
Chin, P.
;
Wojtowicz, M.
... - p. None , 2006
Link:
https://doi.org/10.1109/ROCS.2006.323408
RT T1
[Reliability of Compound Semiconductors] ROCS Workshop 2006
: T1
The Effect of Gate Current on the Degradation of GaAs PHEMT MMICs
UL https://suche.suub.uni-bremen.de/peid=ieee-4118086&Exemplar=1&LAN=DE A1 Chou, Y. C. A1 Chin, P. A1 Wojtowicz, M. A1 Block, T. A1 Oki, A. A1 Luo, B-w A1 Leung, D. A1 Kan, Q. A1 Biedenbender, M. A1 Bhorania, R. A1 Lai, R. A1 Eng, D. A1 Farkas, D. YR 2006 K1 Degradation K1 Gallium arsenide K1 PHEMTs K1 MMICs K1 Electrons K1 Temperature K1 Schottky barriers K1 Schottky diodes K1 Voltage K1 Lead SP None LK http://dx.doi.org/https://doi.org/10.1109/ROCS.2006.323408 DO https://doi.org/10.1109/ROCS.2006.323408 SF ELIB - SuUB Bremen
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