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1 Ergebnisse
1
MOSFET Power Consumption Validation In Flyback Switching Co..:
, In:
TENCON 2006 - 2006 IEEE Region 10 Conference
,
Lee, Watson
;
Zhang, Yu Bian
- p. None , 2006
Link:
https://doi.org/10.1109/TENCON.2006.343782
RT T1
TENCON 2006 - 2006 IEEE Region 10 Conference
: T1
MOSFET Power Consumption Validation In Flyback Switching Converter Design
UL https://suche.suub.uni-bremen.de/peid=ieee-4142457&Exemplar=1&LAN=DE A1 Lee, Watson A1 Zhang, Yu Bian YR 2006 SN 2159-3442 SN 2159-3450 K1 MOSFET circuits K1 Power MOSFET K1 Energy consumption K1 Switching converters K1 Temperature K1 Switching loss K1 Energy management K1 Power dissipation K1 Voltage K1 Thermal management SP None LK http://dx.doi.org/https://doi.org/10.1109/TENCON.2006.343782 DO https://doi.org/10.1109/TENCON.2006.343782 SF ELIB - SuUB Bremen
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