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1 Ergebnisse
1
Leak Detection of Integrated Circuits and Other Semiconduct..:
, In:
12th International Reliability Physics Symposium
,
Stanley, A. G.
;
Rader, C. M.
;
Neff, G.
- p. None , 1974
Link:
https://doi.org/10.1109/IRPS.1974.362652
RT T1
12th International Reliability Physics Symposium
: T1
Leak Detection of Integrated Circuits and Other Semiconductor Devices on Multilayer Circuit Boards
UL https://suche.suub.uni-bremen.de/peid=ieee-4208030&Exemplar=1&LAN=DE A1 Stanley, A. G. A1 Rader, C. M. A1 Neff, G. YR 1974 SN 0735-0791 K1 Leak detection K1 Semiconductor devices K1 Nonhomogeneous media K1 Printed circuits K1 Circuit testing K1 Radiation detectors K1 Radioactive materials K1 Lead K1 Corrosion K1 Soldering SP None LK http://dx.doi.org/https://doi.org/10.1109/IRPS.1974.362652 DO https://doi.org/10.1109/IRPS.1974.362652 SF ELIB - SuUB Bremen
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