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1 Ergebnisse
1
Extended Reliability Study of High Density PZT Capacitors: ..:
, In:
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual
,
Bouyssou, E.
;
Guegan, G.
;
Bruyere, S.
... - p. None , 2007
Link:
https://doi.org/10.1109/RELPHY.2007.369929
RT T1 <cTitle>2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual</cTitle>: T1 <Title>Extended Reliability Study of High Density PZT Capacitors: Intrinsic Lifetime Determination and Wafer Level Screening Strategy</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-4227670&Exemplar=1&LAN=DE A1 Bouyssou, E. A1 Guegan, G. A1 Bruyere, S. A1 Pezzani, R. A1 Berneux, L. A1 de Morais, L. Dantas A1 Rebrasse, J.-P. A1 Anceau, C. A1 Nopper, C. YR 2007 SN 1541-7026 SN 1938-1891 K1 Capacitors K1 Failure analysis K1 Voltage K1 High K dielectric materials K1 High-K gate dielectrics K1 Capacitance K1 Dielectric breakdown K1 Stress K1 Life testing K1 Temperature K1 PZT K1 capacitors K1 WLR K1 reliability K1 lifetime K1 screening SP None LK http://dx.doi.org/https://doi.org/10.1109/RELPHY.2007.369929 DO https://doi.org/10.1109/RELPHY.2007.369929 SF ELIB - SuUB Bremen
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