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1 Ergebnisse
1
A 45nm Low-Standby-Power Embedded SRAM with Improved Immuni..:
, In:
2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers
,
Yabuuchi, Makoto
;
Oashi, Toshiyuki
;
Hashimoto, Keiji
... - p. None , 2007
Link:
https://doi.org/10.1109/ISSCC.2007.373426
RT T1 <cTitle>2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers</cTitle>: T1 <Title>A 45nm Low-Standby-Power Embedded SRAM with Improved Immunity Against Process and Temperature Variations</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-4242397&Exemplar=1&LAN=DE A1 Yabuuchi, Makoto A1 Oashi, Toshiyuki A1 Hashimoto, Keiji A1 Sebe, Akio A1 Okazaki, Gen A1 Satomi, Katsuji A1 Akamatsu, Hironori A1 Shinohara, Hirofumi A1 Nii, Koji A1 Tsukamoto, Yasumasa A1 Ohbayashi, Shigeki A1 Imaoka, Susumu A1 Makino, Hiroshi A1 Yamagami, Yoshinobu A1 Ishikura, Satoshi A1 Terano, Toshio YR 2007 SN 0193-6530 SN 2376-8606 K1 Random access memory K1 Voltage K1 Degradation K1 MOS devices K1 CMOS technology K1 Rats K1 Driver circuits K1 Temperature dependence K1 Circuit simulation K1 Decoding SP None LK http://dx.doi.org/https://doi.org/10.1109/ISSCC.2007.373426 DO https://doi.org/10.1109/ISSCC.2007.373426 SF ELIB - SuUB Bremen
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