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1 Ergebnisse
1
Three dimensional chip stacking using a wafer-to-wafer inte..:
, In:
2007 IEEE International Interconnect Technology Conferencee
,
Chatterjee, Ritwik
;
Zussy, Marc
;
Roman, Antonio
... - p. None , 2007
Link:
https://doi.org/10.1109/IITC.2007.382355
RT T1
2007 IEEE International Interconnect Technology Conferencee
: T1
Three dimensional chip stacking using a wafer-to-wafer integration
UL https://suche.suub.uni-bremen.de/peid=ieee-4263667&Exemplar=1&LAN=DE A1 Chatterjee, Ritwik A1 Zussy, Marc A1 Roman, Antonio A1 Louveau, Olivier A1 Maitrejean, Sylvain A1 Louis, Didier A1 Kernevez, Nelly A1 Sillon, Nicolas A1 Passemard, Gerard A1 Pol, Victor A1 Mathew, Varughese A1 Fayolle, Murielle A1 Garcia, Sam A1 Sparks, Terry A1 Huang, Zhihong A1 Leduc, Patrick A1 Pozder, Scott A1 Jones, Bob A1 Acosta, Eddie A1 Charlet, Barbara A1 Enot, Thierry A1 Heitzmann, Michel YR 2007 SN 2380-632X SN 2380-6338 K1 Stacking K1 Wafer bonding K1 Integrated circuit interconnections K1 Integrated circuit technology K1 Silicon on insulator technology K1 Dielectric measurements K1 Throughput K1 Electric variables measurement K1 Size measurement K1 Testing SP None LK http://dx.doi.org/https://doi.org/10.1109/IITC.2007.382355 DO https://doi.org/10.1109/IITC.2007.382355 SF ELIB - SuUB Bremen
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