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1 Ergebnisse
1
A Configurable Modular Test Processor and Scan Controller A..:
, In:
13th IEEE International On-Line Testing Symposium (IOLTS 2007)
,
Brandenburg, R. Frost
;
Rudolph, D.
;
Galke, C.
.. - p. None , 2007
Link:
https://doi.org/10.1109/IOLTS.2007.6
RT T1
13th IEEE International On-Line Testing Symposium (IOLTS 2007)
: T1
A Configurable Modular Test Processor and Scan Controller Architecture
UL https://suche.suub.uni-bremen.de/peid=ieee-4274867&Exemplar=1&LAN=DE A1 Brandenburg, R. Frost A1 Rudolph, D. A1 Galke, C. A1 Kothe, R. A1 Vierhaus, H.T. YR 2007 SN 1942-9398 SN 1942-9401 K1 Process control K1 Logic testing K1 Automatic testing K1 System testing K1 Logic devices K1 System-on-a-chip K1 Wiring K1 Control systems K1 Computer architecture K1 Application software SP None LK http://dx.doi.org/https://doi.org/10.1109/IOLTS.2007.6 DO https://doi.org/10.1109/IOLTS.2007.6 SF ELIB - SuUB Bremen
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