Titel

Merkliste
1 Ergebnisse

Re-Using Clock Management Unit to implement Power Gating an..:

, In: 2007 IEEE International Conference on Integrated Circuit Design and Technology,

Royannez, P. ; Jumel, F. ; Mair, H.... - p. None , 2007

Link: https://doi.org/10.1109/ICICDT.2007.4299538

RT 
T1 <cTitle>2007 IEEE International Conference on Integrated Circuit Design and Technology</cTitle>: T1 <Title>Re-Using Clock Management Unit to implement Power Gating and Retention for Leakage Reduction at the 65-nm Technology Node</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-4299538&Exemplar=1&LAN=DE
				
A1 Royannez, P.
A1 Jumel, F.
A1 Mair, H.
A1 Scott, D.
A1 Rachidi, A. Er
A1 Lagerquist, R.
A1 Chau, M.
A1 Gururajarao, S.
A1 Thiruvengadam, S.
A1 Clinton, M.
A1 Menezes, V.
A1 Hollingsworth, R.
A1 Vaccani, J.
A1 Piacibello, F.
A1 Culp, N.
A1 Rosal, J.
A1 Ball, M.
A1 Ben-Amar, F.
A1 Bouetel, L.
A1 Domerego, O.
A1 Lachese, J.L.
A1 Fournet-Fayard, C.
A1 Ciroux, J.
A1 Raibaut, C.
A1 Ko, U.
YR 2007
SN 2381-3555
K1 Clocks
K1 Energy management
K1 Technology management
K1 Power system management
K1 Switches
K1 Control systems
K1 Random access memory
K1 Voltage
K1 Modems
K1 Leakage current
K1 Leakage power management
K1 wireless SoC
SP None
LK http://dx.doi.org/https://doi.org/10.1109/ICICDT.2007.4299538
DO https://doi.org/10.1109/ICICDT.2007.4299538
SF ELIB - SuUB Bremen

Export

RefWorks (nur Desktop-Version!)
Flow (Zuerst in Flow einloggen, dann importieren)