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1 Ergebnisse
1
Gate-all-around Twin Silicon nanowire SONOS Memory:
, In:
2007 IEEE Symposium on VLSI Technology
,
Suk, Sung Dae
;
Yeo, Kyoung Hwan
;
Cho, Keun Hwi
... - p. None , 2007
Link:
https://doi.org/10.1109/VLSIT.2007.4339760
RT T1
2007 IEEE Symposium on VLSI Technology
: T1
Gate-all-around Twin Silicon nanowire SONOS Memory
UL https://suche.suub.uni-bremen.de/peid=ieee-4339760&Exemplar=1&LAN=DE A1 Suk, Sung Dae A1 Yeo, Kyoung Hwan A1 Cho, Keun Hwi A1 Li, Ming A1 Yeoh, Yun young A1 Hong, Ki-Ha A1 Kim, Sung-Han A1 Koh, Young-Ho A1 Jung, Sunggon A1 Jang, WonJun A1 Kim, Dong-Won A1 Park, Donggun A1 Ryu, Byung-Il YR 2007 SN 0743-1562 SN 2158-9682 K1 SONOS devices K1 Tunneling K1 Silicon compounds K1 Nanoscale devices K1 Photonic band gap K1 Research and development K1 Channel hot electron injection K1 Hot carriers K1 Nonvolatile memory K1 Interference SP None LK http://dx.doi.org/https://doi.org/10.1109/VLSIT.2007.4339760 DO https://doi.org/10.1109/VLSIT.2007.4339760 SF ELIB - SuUB Bremen
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