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1 Ergebnisse
1
Wide-Band Simulation and Characterization of Digital Substr..:
, In:
2007 IEEE International SOI Conference
,
Bol, D.
;
Ambroise, R.
;
Roda Neve, C.
.. - p. None , 2007
Link:
https://doi.org/10.1109/SOI.2007.4357888
RT T1
2007 IEEE International SOI Conference
: T1
Wide-Band Simulation and Characterization of Digital Substrate Noise in SOI Technology
UL https://suche.suub.uni-bremen.de/peid=ieee-4357888&Exemplar=1&LAN=DE A1 Bol, D. A1 Ambroise, R. A1 Roda Neve, C. A1 Raskin, J.-P. A1 Flandre, D. YR 2007 SN 1078-621X K1 Wideband K1 Integrated circuit noise K1 Circuit simulation K1 Integrated circuit technology K1 Mixed analog digital integrated circuits K1 Noise generators K1 Radio frequency K1 CMOS process K1 Conductivity K1 CMOS technology SP None LK http://dx.doi.org/https://doi.org/10.1109/SOI.2007.4357888 DO https://doi.org/10.1109/SOI.2007.4357888 SF ELIB - SuUB Bremen
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