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Electrical OverStress/ElectroStatic Discharges (EOS/ESD) Sp..:

, In: 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits,
Caillard, B. ; Pellet, C. ; Touboul, A... - p. None , 2007
Link: https://doi.org/10.1109/IPFA.2007.4378067