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1 Ergebnisse
1
Combined piezo-force microscopy and conductive atomic-force..:
, In:
2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics
,
Lee, Hyun Ju
;
Lee, Keun
;
Shin, Yong Cheol
... - p. None , 2007
Link:
https://doi.org/10.1109/ISAF.2007.4393267
RT T1 <cTitle>2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics</cTitle>: T1 <Title>Combined piezo-force microscopy and conductive atomic-force microscopy for investigating leakage current conduction and local domain structure of PbTiO3 thin films</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-4393267&Exemplar=1&LAN=DE A1 Lee, Hyun Ju A1 Lee, Keun A1 Shin, Yong Cheol A1 Kim, Gun Hwan A1 Hwang, Cheol Seong A1 Hong, Jae Wan YR 2007 SN 1099-4734 SN 2375-0448 K1 Microscopy K1 Leakage current K1 Morphology K1 Heating K1 Ferroelectric materials K1 Conductive films K1 Crystallization K1 Cooling K1 Ferroelectric films K1 Electrodes SP None LK http://dx.doi.org/https://doi.org/10.1109/ISAF.2007.4393267 DO https://doi.org/10.1109/ISAF.2007.4393267 SF ELIB - SuUB Bremen
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