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1 Ergebnisse
1
Temperature dependent transport characteristics of multi-br..:
, In:
2007 International Semiconductor Device Research Symposium
,
Jung, Young Chai
;
Kim, Dong-Won
;
Park, Donggun
... - p. None , 2007
Link:
https://doi.org/10.1109/ISDRS.2007.4422231
RT T1 <cTitle>2007 International Semiconductor Device Research Symposium</cTitle>: T1 <Title>Temperature dependent transport characteristics of multi-bridge-channel MOSFETs (MBCFETs)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-4422231&Exemplar=1&LAN=DE A1 Jung, Young Chai A1 Kim, Dong-Won A1 Park, Donggun A1 Cho, Keun Hwi A1 Hong, Byoung Hak A1 Hong, Su Heon A1 Hwang, Sung Woo A1 Ahn, D. A1 Lee, Sung-Young A1 Kim, Min-Sang A1 Yoon, Eun-Jung YR 2007 K1 Temperature dependence K1 MOSFETs K1 Scattering K1 Rough surfaces K1 Surface roughness K1 Silicon K1 Current measurement K1 Phonons K1 Educational institutions K1 Nanoscale devices SP None LK http://dx.doi.org/https://doi.org/10.1109/ISDRS.2007.4422231 DO https://doi.org/10.1109/ISDRS.2007.4422231 SF ELIB - SuUB Bremen
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