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1 Ergebnisse
1
Leakage effect suppression in charge pumping measurement an..:
, In:
2007 International Semiconductor Device Research Symposium
,
Chun-Chang Lu
;
Kuei-Shu Chang-Liao
;
Chun-Yuan Lu
.. - p. None , 2007
Link:
https://doi.org/10.1109/ISDRS.2007.4422559
RT T1 <cTitle>2007 International Semiconductor Device Research Symposium</cTitle>: T1 <Title>Leakage effect suppression in charge pumping measurement and stress-induced traps in high-k Gated MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-4422559&Exemplar=1&LAN=DE A1 Chun-Chang Lu A1 Kuei-Shu Chang-Liao A1 Chun-Yuan Lu A1 Shih-Chang Chang A1 Tien-Ko Wang YR 2007 K1 Charge pumps K1 Current measurement K1 Charge measurement K1 Stress measurement K1 High K dielectric materials K1 High-K gate dielectrics K1 MOSFETs K1 MOS devices K1 Dielectric measurements K1 Silicon compounds SP None LK http://dx.doi.org/https://doi.org/10.1109/ISDRS.2007.4422559 DO https://doi.org/10.1109/ISDRS.2007.4422559 SF ELIB - SuUB Bremen
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