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1 Ergebnisse
1
Multi-gate devices for the 32nm technology node and beyond:
, In:
ESSDERC 2007 - 37th European Solid State Device Research Conference
,
Collaert, N.
;
Rooyackers, R.
;
Schulz, T.
... - p. None , 2007
Link:
https://doi.org/10.1109/ESSDERC.2007.4430899
RT T1
ESSDERC 2007 - 37th European Solid State Device Research Conference
: T1
Multi-gate devices for the 32nm technology node and beyond
UL https://suche.suub.uni-bremen.de/peid=ieee-4430899&Exemplar=1&LAN=DE A1 Collaert, N. A1 Rooyackers, R. A1 Schulz, T. A1 San, K.T. A1 Son, N.J. A1 Van Dal, M.J.H. A1 Verheyen, P. A1 von Arnim, K. A1 Witters, L. A1 De Meyer, K. A1 Biesemans, S. A1 De Keersgieter, A. A1 Jurczak, M. A1 Dixit, A. A1 Ferain, I. A1 Lai, L.-S. A1 Lenoble, D. A1 Mercha, A. A1 Nackaerts, A. A1 Pawlak, B.J. YR 2007 SN 1930-8876 SN 2378-6558 K1 Lithography K1 MOSFETs K1 Circuits K1 Fluctuations K1 Instruments K1 Centralized control K1 Tunneling K1 FinFETs K1 Leakage current K1 Large scale integration SP None LK http://dx.doi.org/https://doi.org/10.1109/ESSDERC.2007.4430899 DO https://doi.org/10.1109/ESSDERC.2007.4430899 SF ELIB - SuUB Bremen
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