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1 Ergebnisse
1
RF Noise Modeling of CMOS 90nm Device Using Enhanced BSIM4 ..:
, In:
2007 IEEE International Workshop on Radio-Frequency Integration Technology
,
Shi, Jinglin
;
Xiong, Yong Zhong
;
Issaoun, Ammar
... - p. None , 2007
Link:
https://doi.org/10.1109/RFIT.2007.4443952
RT T1 <cTitle>2007 IEEE International Workshop on Radio-Frequency Integration Technology</cTitle>: T1 <Title>RF Noise Modeling of CMOS 90nm Device Using Enhanced BSIM4 with Additional Noise Source</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-4443952&Exemplar=1&LAN=DE A1 Shi, Jinglin A1 Xiong, Yong Zhong A1 Issaoun, Ammar A1 Nan, Lan A1 Lin, Fujiang A1 Peng, A. S. A1 Cho, M. H. A1 Chen, D. A1 Yeh, C. S. YR 2007 K1 Radio frequency K1 Semiconductor device modeling K1 Low-frequency noise K1 CMOS technology K1 Foundries K1 Circuit noise K1 Thermal resistance K1 Integrated circuit modeling K1 Noise measurement K1 Performance evaluation K1 BSIM4 K1 CMOS 90nm device K1 RF noise K1 modeling K1 noise source K1 van der Ziel SP None LK http://dx.doi.org/https://doi.org/10.1109/RFIT.2007.4443952 DO https://doi.org/10.1109/RFIT.2007.4443952 SF ELIB - SuUB Bremen
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