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Impact of Source/Drain Tie on a 30 nm Bottom Gate MOSFETs:

, In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits,
Lin, Jyi-Tsong ; Lin, Jeng-Da ; Shiang-Shi, Kang... - p. None , 2007
Link: https://doi.org/10.1109/EDSSC.2007.4450192