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1 Ergebnisse
1
Dynamic Nano-scale Surface Profilometry Using Stroboscopic ..:
, In:
IECON 2007 - 33rd Annual Conference of the IEEE Industrial Electronics Society
,
Chen, Liang-Chia
;
Lai, Huang-Wen
;
Huang, Yao-Ting
... - p. None , 2007
Link:
https://doi.org/10.1109/IECON.2007.4460184
RT T1 <cTitle>IECON 2007 - 33rd Annual Conference of the IEEE Industrial Electronics Society</cTitle>: T1 <Title>Dynamic Nano-scale Surface Profilometry Using Stroboscopic Interferometry</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-4460184&Exemplar=1&LAN=DE A1 Chen, Liang-Chia A1 Lai, Huang-Wen A1 Huang, Yao-Ting A1 Chang, Jui-Chin A1 Chang, Calvin C. A1 Chen, Jin-Liang YR 2007 SN 1553-572X K1 Optical interferometry K1 Optical microscopy K1 Bandwidth K1 Resonance K1 Optical noise K1 Noise measurement K1 Image processing K1 Deconvolution K1 Signal to noise ratio K1 Hardware SP None LK http://dx.doi.org/https://doi.org/10.1109/IECON.2007.4460184 DO https://doi.org/10.1109/IECON.2007.4460184 SF ELIB - SuUB Bremen
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