I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Reliability investigation of NiPtSi electrical fuse with di..:
, In:
2007 IEEE International Integrated Reliability Workshop Final Report
,
Tian, C.
;
Moy, D.
;
Messenger, B.
... - p. None , 2007
Link:
https://doi.org/10.1109/IRWS.2007.4469228
RT T1
2007 IEEE International Integrated Reliability Workshop Final Report
: T1
Reliability investigation of NiPtSi electrical fuse with different programming mechanisms
UL https://suche.suub.uni-bremen.de/peid=ieee-4469228&Exemplar=1&LAN=DE A1 Tian, C. A1 Moy, D. A1 Messenger, B. A1 Kothandaraman, C. A1 Safran, J. A1 Wu, S. A1 Robson, N. A1 Iyer, SS. YR 2007 SN 1930-8841 SN 2374-8036 K1 Fuses K1 Electromigration K1 Thermal resistance K1 Electric resistance K1 Circuit testing K1 Thermal stresses K1 Functional programming K1 Semiconductor device reliability K1 Thermal stability K1 Circuit stability K1 NiPtSi electrical fuse K1 resistance stability K1 reliability K1 programming mechanism SP None LK http://dx.doi.org/https://doi.org/10.1109/IRWS.2007.4469228 DO https://doi.org/10.1109/IRWS.2007.4469228 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)