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Reliability studies of AuGe/Ni/Au ohmic contacts to MESFETs..:

, In: 2007 International Workshop on Physics of Semiconductor Devices,
Sai Saravanan, G. ; Mahadeva Bhat, K. ; Vyas, H.P.... - p. None , 2007
Link: https://doi.org/10.1109/IWPSD.2007.4472550