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1 Ergebnisse
1
Future trend of flash memories:
, In:
2007 IEEE International Workshop on Memory Technology, Design and Testing
,
Yi-Chou Chen
;
Rich Liu
- p. None , 2007
Link:
https://doi.org/10.1109/MTDT.2007.4547607
RT T1 <cTitle>2007 IEEE International Workshop on Memory Technology, Design and Testing</cTitle>: T1 <Title>Future trend of flash memories</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-4547607&Exemplar=1&LAN=DE A1 Yi-Chou Chen A1 Rich Liu YR 2007 SN 1087-4852 K1 Flash memory K1 Nonvolatile memory K1 Solid state circuits K1 Explosives K1 Digital cameras K1 Universal Serial Bus K1 Digital audio players K1 Tunneling K1 History K1 Stacking SP None LK http://dx.doi.org/https://doi.org/10.1109/MTDT.2007.4547607 DO https://doi.org/10.1109/MTDT.2007.4547607 SF ELIB - SuUB Bremen
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