I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
An advanced full path loop-back testing techniques for embe..:
, In:
2008 71st ARFTG Microwave Measurement Conference
,
Boyon Kim
;
Park, Il-Chan
;
Dusik Yoo
... - p. None , 2008
Link:
https://doi.org/10.1109/ARFTG.2008.4633308
RT T1
2008 71st ARFTG Microwave Measurement Conference
: T1
An advanced full path loop-back testing techniques for embedded RF Identification (RFID) System-on-a-Chip (SoC) applications
UL https://suche.suub.uni-bremen.de/peid=ieee-4633308&Exemplar=1&LAN=DE A1 Boyon Kim A1 Park, Il-Chan A1 Dusik Yoo A1 Jihoon Koo A1 Inhyuk Kim A1 Byung-wook Choi A1 Yongtae Bae A1 Byeong-Yun Kim YR 2008 K1 Radio frequency K1 System-on-a-chip K1 Radiofrequency identification K1 Testing K1 Gain K1 Transceivers K1 Electronics packaging K1 test methodologies K1 Loop-back testing technique K1 RFID K1 SoC applications SP None LK http://dx.doi.org/https://doi.org/10.1109/ARFTG.2008.4633308 DO https://doi.org/10.1109/ARFTG.2008.4633308 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)