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1 Ergebnisse
1
Double-well field effect diode vs. SCR behavior under CDM s..:
, In:
2008 IEEE International SOI Conference
,
Salman, Akram A.
;
Cao, Shuqing
;
Beebe, Stephen G.
.. - p. None , 2008
Link:
https://doi.org/10.1109/SOI.2008.4656335
RT T1
2008 IEEE International SOI Conference
: T1
Double-well field effect diode vs. SCR behavior under CDM stress in 45nm SOI technology
UL https://suche.suub.uni-bremen.de/peid=ieee-4656335&Exemplar=1&LAN=DE A1 Salman, Akram A. A1 Cao, Shuqing A1 Beebe, Stephen G. A1 Pelella, Mario M. A1 Dutton, Robert W. YR 2008 SN 1078-621X K1 Conference proceedings SP None LK http://dx.doi.org/https://doi.org/10.1109/SOI.2008.4656335 DO https://doi.org/10.1109/SOI.2008.4656335 SF ELIB - SuUB Bremen
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