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1 Ergebnisse
1
Fewest vias design for microstrip guard trace by using over..:
, In:
2008 IEEE-EPEP Electrical Performance of Electronic Packaging
,
Cheng, Yung-Shou
;
Guo, Wei-Da
;
Shiue, Guang-Hwa
... - p. None , 2008
Link:
https://doi.org/10.1109/EPEP.2008.4675945
RT T1
2008 IEEE-EPEP Electrical Performance of Electronic Packaging
: T1
Fewest vias design for microstrip guard trace by using overlying dielectric
UL https://suche.suub.uni-bremen.de/peid=ieee-4675945&Exemplar=1&LAN=DE A1 Cheng, Yung-Shou A1 Guo, Wei-Da A1 Shiue, Guang-Hwa A1 Cheng, Hung-Hsiang A1 Wang, Chen-Chao A1 Wu, Ruey-Beei YR 2008 SN 2165-4107 SN 2165-4115 K1 Microstrip K1 Dielectric substrates K1 Resonance K1 Degradation K1 Integrated circuit interconnections K1 Design methodology K1 Noise reduction K1 Circuit noise K1 High-K gate dielectrics K1 Routing SP None LK http://dx.doi.org/https://doi.org/10.1109/EPEP.2008.4675945 DO https://doi.org/10.1109/EPEP.2008.4675945 SF ELIB - SuUB Bremen
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