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1 Ergebnisse
1
Wafer-Level Characterization of Probecards using NAC Probin:
, In:
2008 IEEE International Test Conference
,
Kim, Gyu-Yeol
;
Byun, Eon-Jo
;
Kang, Ki-Sang
.. - p. None , 2008
Link:
https://doi.org/10.1109/TEST.2008.4700571
RT T1
2008 IEEE International Test Conference
: T1
Wafer-Level Characterization of Probecards using NAC Probing
UL https://suche.suub.uni-bremen.de/peid=ieee-4700571&Exemplar=1&LAN=DE A1 Kim, Gyu-Yeol A1 Byun, Eon-Jo A1 Kang, Ki-Sang A1 Jun, Young-Hyun A1 Kong, Bai-Sun YR 2008 SN 1089-3539 SN 2378-2250 K1 Costs K1 Test equipment K1 Electronic equipment testing K1 Circuit testing K1 Consumer electronics K1 Wafer scale integration K1 Packaging K1 Needles K1 Calibration K1 Insertion loss SP None LK http://dx.doi.org/https://doi.org/10.1109/TEST.2008.4700571 DO https://doi.org/10.1109/TEST.2008.4700571 SF ELIB - SuUB Bremen
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