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1 Ergebnisse
1
Damaged Mechanism Research of RS232 Interface under Electro..:
, In:
2008 International Conference on Computer Science and Software Engineering
,
Gao, Jing
;
Sun, Ji-Yin
;
Chai, Yan-Jie
... - p. None , 2008
Link:
https://doi.org/10.1109/CSSE.2008.852
RT T1 <cTitle>2008 International Conference on Computer Science and Software Engineering</cTitle>: T1 <Title>Damaged Mechanism Research of RS232 Interface under Electromagnetic Pulse</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-4722537&Exemplar=1&LAN=DE A1 Gao, Jing A1 Sun, Ji-Yin A1 Chai, Yan-Jie A1 Wang, Bo A1 Tao, Ling-Jiao A1 Bao, Fei-Hu YR 2008 K1 EMP radiation effects K1 Voltage K1 Testing K1 Electromagnetic coupling K1 Transportation K1 Embedded system K1 Computer peripherals K1 Protocols K1 Protection K1 Data communication K1 EMP K1 RS232-Interfaces K1 Logistic-Regression SP None LK http://dx.doi.org/https://doi.org/10.1109/CSSE.2008.852 DO https://doi.org/10.1109/CSSE.2008.852 SF ELIB - SuUB Bremen
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