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1 Ergebnisse
1
Combined Super-STEM imaging, EEL and PL spectroscopy of un-..:
, In:
2008 Conference on Optoelectronic and Microelectronic Materials and Devices
,
Crowe, Iain F
;
Roschuk, Tyler
;
Bangert, Ursel
... - p. None , 2008
Link:
https://doi.org/10.1109/COMMAD.2008.4802117
RT T1 <cTitle>2008 Conference on Optoelectronic and Microelectronic Materials and Devices</cTitle>: T1 <Title>Combined Super-STEM imaging, EEL and PL spectroscopy of un-doped and Er doped SRSO on Si</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-4802117&Exemplar=1&LAN=DE A1 Crowe, Iain F A1 Roschuk, Tyler A1 Bangert, Ursel A1 Sherliker, Ben A1 Halsall, Matthew P A1 Knights, Andrew A1 Mascher, Peter YR 2008 SN 1097-2137 SN 2377-5505 K1 Spectroscopy K1 Erbium K1 Chemical analysis K1 Plasma temperature K1 Image analysis K1 Scanning electron microscopy K1 Transmission electron microscopy K1 Energy loss K1 Semiconductor thin films K1 Sputtering K1 nano-crystalline silicon K1 PECVD K1 STEM K1 EELs SP None LK http://dx.doi.org/https://doi.org/10.1109/COMMAD.2008.4802117 DO https://doi.org/10.1109/COMMAD.2008.4802117 SF ELIB - SuUB Bremen
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